DocumentCode :
2612734
Title :
Achieving high-bandwidth nanopositioning in presence of plant uncertainties
Author :
Aphale, Sumeet S. ; Devasia, Santosh ; Moheimani, S. O Reza
Author_Institution :
ARC Centre for Complex, Newcastle Univ., Callaghan, NSW
fYear :
2008
fDate :
2-5 July 2008
Firstpage :
943
Lastpage :
948
Abstract :
In the absence of plant parameter uncertainties, inversion-based feedforward techniques have been known to deliver accurate tracking performance. Due to changes in operating conditions like ambient temperature, humidity and loading, piezoelectric-stack actuated nanopositioning platforms can undergo significant changes in their system parameters. Nonlinear effects of hysteresis, an inherent property of a piezoelectric actuator, are also present; charge actuation is applied to reduce the effects of hysteresis. In this work, a suitable feedback controller that reduces the effects of parameter uncertainties is integrated with the inversion-based feedforward technique to deliver accurate nanopositioning over a large bandwidth. It is shown experimentally that by integrating closed-loop damping, inversion-based feedforward and charge actuation, the tracking bandwidth of the platform from can be increased significantly from 310 Hz to 1320 Hz.
Keywords :
closed loop systems; feedback; feedforward; nanopositioning; piezoelectric actuators; uncertain systems; ambient temperature; closed-loop damping; feedback controller; frequency 310 Hz to 1320 Hz; high-bandwidth nanopositioning; hysteresis effects; inversion-based feedforward technique; inversion-based feedforward-charge actuation; nonlinear effects; piezoelectric-stack actuated nanopositioning platforms; plant parameter uncertainties; tracking performance; Adaptive control; Bandwidth; Damping; Humidity; Hysteresis; Nanopositioning; Piezoelectric actuators; Temperature; Uncertain systems; Uncertainty; Feedback; Feedforward; Nanopositioning; high-speed tracking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Intelligent Mechatronics, 2008. AIM 2008. IEEE/ASME International Conference on
Conference_Location :
Xian
Print_ISBN :
978-1-4244-2494-8
Electronic_ISBN :
978-1-4244-2495-5
Type :
conf
DOI :
10.1109/AIM.2008.4601788
Filename :
4601788
Link To Document :
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