DocumentCode

2612773

Title

Radiation Effects in GaAs Devices and ICs

Author

Anderson, W.T., Jr. ; Binari, S.C.

Author_Institution

Naval Research Laboratory, Washington, D. C. 20375

fYear

1983

fDate

30407

Firstpage

316

Lastpage

319

Keywords

Electron traps; FETs; Gallium arsenide; JFETs; Neutrons; Particle measurements; Radiation effects; Schottky diodes; Time measurement; Transient response;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1983. 21st Annual

Conference_Location

Phoenix, AZ, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1983.362004

Filename

4208525