• DocumentCode
    2613127
  • Title

    Improved Sensitivity for Hot Spot Detection using Liquid Crystals

  • Author

    Burgess, David ; Tan, Peng

  • Author_Institution
    Hewlett Packard Corporate Quality, 1681 Page Mill Road, Building 28B, Palo Alto, California 94304
  • fYear
    1984
  • fDate
    30773
  • Firstpage
    119
  • Lastpage
    121
  • Keywords
    Chemicals; Crystalline materials; Failure analysis; Lighting; Liquid crystal devices; Liquid crystals; Milling machines; Optical polarization; Optical surface waves; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1984. 22nd Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1984.362028
  • Filename
    4208552