DocumentCode :
2613199
Title :
Stored energy electrical connectors
Author :
Tamm, Carl R.
Author_Institution :
Cyto, Meridian, Inc
fYear :
2000
fDate :
2000
Firstpage :
129
Lastpage :
134
Abstract :
This report focuses on the reliability of electrical terminations. We explore the factors which comprise high integrity connections, and those which contribute to failures thereof. We conduct a complete review of the dynamics of electrical connections and analysis of the new technology of “spring compression” in larger cable connectors. Electrical equipment failures are all predominantly traced back to connector or termination failures. These are due in part to poor workmanship resulting in perhaps improper installation, improper use of installation tools, and simply failures of aging connections. Much research has been done to identify these various causes of failure within the termination itself. Integrity and stability of the interface between the conductor, the connector, and the termination point may be affected by many factors. Among these are; differing coefficients of linear expansion, oxidation of the materials, electrochemical reactivity or corrosion, creep or material cold flow, the effects of vibration and magnetostriction, and thermal aging due to heat cycling. These characteristics indicate that in the microscopic world of the electrical interface of a connector, we are dealing with a dynamic rather than a static issue. Research has indicated that elasticity in the immediate area of the electrical interface can be designed to compensate for these adverse effects
Keywords :
corrosion; creep; electric connectors; oxidation; reliability; vibrations; cable connectors; corrosion; creep; elasticity; electrical connections dynamics; electrical equipment failures; electrical interface; electrical terminations; electrochemical reactivity; heat cycling; high integrity connections; interface stability; linear expansion; magnetostriction; material cold flow; oxidation; reliability; spring compression; stored energy electrical connectors; thermal aging; vibration; Aging; Conducting materials; Connectors; Corrosion; Creep; Equipment failure; Magnetic materials; Magnetostriction; Oxidation; Stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Construction, Operation and Live-Line Maintenance Proceedings. 2000 IEEE ESMO - 2000 IEEE 9th International Conference on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6625-5
Type :
conf
DOI :
10.1109/TDCLLM.2000.882810
Filename :
882810
Link To Document :
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