مرکز منطقه ای اطلاع رساني علوم و فناوري - Dynamic Fault Imaging of VLSI Random Logic Devices

DocumentCode :

2613666

Title :

Dynamic Fault Imaging of VLSI Random Logic Devices

Author :

May, T.C. ; Scott, G.L. ; Meieran, E.S. ; Winer, P. ; Rao, V.R.

fYear :

1984

fDate :

30773

Firstpage :

281

Lastpage :

283

Keywords :

Bonding; Logic devices; Microprocessors; Testing; Very large scale integration;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Reliability Physics Symposium, 1984. 22nd Annual

Conference_Location :

Las Vegas, NV, USA

ISSN :

0735-0791

Type :

conf

DOI :

10.1109/IRPS.1984.362061

Filename :

4208585

Link To Document :