DocumentCode

2613666

Title

Dynamic Fault Imaging of VLSI Random Logic Devices

Author

May, T.C. ; Scott, G.L. ; Meieran, E.S. ; Winer, P. ; Rao, V.R.

fYear

1984

fDate

30773

Firstpage

281

Lastpage

283

Keywords

Bonding; Logic devices; Microprocessors; Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1984. 22nd Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1984.362061

Filename

4208585