Title :
Inverstigation of high turn-on speed MOS-Triggered SCR in 0.13μm CMOS process
Author :
Song, Bo ; Han, Yan ; Ma, Fei ; Zhu, Kenhan
Author_Institution :
Dept. of Inf. Sci. & Electr. Eng., Zhejiang Univ., Hangzhou, China
Abstract :
MOS-Triggered Silicon Controlled Rectifier(SCR) has been used as on chip Electrostatic Discharge (ESD) protection. However, the inherit slow turn-on speed is a major drawback of SCR. The compact MOS-Triggered SCR devices have been proposed and investigated in a 0.13μm CMOS process with the consideration of turn-on speed. From the test results, the turn on time of compact MOS-Triggered SCR has improved from ~13ns of merged MOS-triggered SCR to ~4ns. Compared to merged MOS-Triggered SCR devices, the compact MOS-Triggered SCR devices has a lower trigger voltage, higher turn-on speed, lower overshoot voltage lower turn-on resistance and higher failure current which makes it more suitable for nanometer CMOS ESD protection.
Keywords :
CMOS integrated circuits; MIS devices; elemental semiconductors; silicon; solid-state rectifiers; CMOS process; MOS-triggered SCR devices; MOS-triggered silicon controlled rectifier; Si; failure current; high turn-on speed MOS-triggered SCR; lower overshoot voltage lower turn-on resistance; nanometer CMOS ESD protection; on chip electrostatic discharge protection; size 0.13 mum; CMOS integrated circuits; CMOS process; Electrostatic discharge; Layout; Logic gates; Resistance; Thyristors;
Conference_Titel :
Microelectronics and Electronics (PrimeAsia), 2010 Asia Pacific Conference on Postgraduate Research in
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-6735-8
Electronic_ISBN :
978-1-4244-6736-5
DOI :
10.1109/PRIMEASIA.2010.5604925