Title :
A digital background nonlinearity calibration algorithm for pipelined ADCs
Author :
Fei, Yuan ; Sin, Sai-Weng ; Seng-Pan, U. ; Martins, Rui Paulo
Author_Institution :
Analog & Mixed Signal VLSI Lab., Univ. of Macau, Macao, China
Abstract :
This paper presents a new digital background calibration algorithm for pipelined analog-to-digital converters (ADCs). Background calibration can extract calibration data without interrupting ADCs normal conversion operation. Digital calibration can relax the design difficulty of analog circuits of ADCs, and gains the improvement of technology scaled down. This algorithm provides a method to effectively estimate the nonlinearity of op amp, and calibrates it in digital domain without any additional analog circuit. Simulation results show that the ENOB can be improved from 6.3b to 10.67b by the proposed algorithm.
Keywords :
analogue-digital conversion; calibration; analog circuits; analog-to-digital converters; background calibration; digital background nonlinearity calibration algorithm; pipelined ADC; Algorithm design and analysis; Analog-digital conversion; Calibration; Gain; Mathematical model; Pipelines; Polynomials;
Conference_Titel :
Microelectronics and Electronics (PrimeAsia), 2010 Asia Pacific Conference on Postgraduate Research in
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-6735-8
Electronic_ISBN :
978-1-4244-6736-5
DOI :
10.1109/PRIMEASIA.2010.5604949