• DocumentCode
    2614723
  • Title

    Fault Contrast: A New Voltage Contrast VLSI Diagnosis Technique

  • Author

    Stivers, Alan R. ; Ferguson, David C.

  • Author_Institution
    Intel Corporation, Santa Clara, CA 95051
  • fYear
    1986
  • fDate
    31503
  • Firstpage
    109
  • Lastpage
    114
  • Abstract
    Fault contrast is a differential analog technique that yields high-quality voltage contrast images of integrated circuit (IC) pass vs. fail operation. Fault contrast is applicable where the IC failure mode is sensitive to an external parameter, e.g. clock frequency or supply voltage. Fault contrast requires only simple and inexpensive analog signal processing. We demonstrate fault contrast with an analysis of an Intel 80286 microprocessor failure.
  • Keywords
    Analog integrated circuits; Circuit faults; Clocks; Failure analysis; Fault diagnosis; Frequency; Integrated circuit yield; Signal processing; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1986. 24th Annual
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1986.362119
  • Filename
    4208650
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2614723