DocumentCode
2614862
Title
Modelling of transport and recombination of photoexcited carriers in a-Si:H and a-SiGe:H
Author
Abel, C.-D. ; Bauer, G.H.
Author_Institution
Inst. fur Phys. Elektronik, Stuttgart Univ., Germany
fYear
1990
fDate
21-25 May 1990
Firstpage
1550
Abstract
The modeling of transport and recombination of photoexcited carriers generated by low bandgap light has been performed to simulate photoconductivity, σph, in a-Si:H and a-SiGe:H solar cells, versus illumination, φ, and temperature, T . For the occupation of states in the gap, rates for trapping, recombination, and remission have been solved by detailed balance: for charge transport, only the extended states contribution is considered. The influence on σph(φ,T ) of characteristic energies of band tails has been analyzed as well as of densities of midgap states, which have been treated by two different approaches: by the conventional defect model (CDM) with D+/D0 at an E c of 1.0 eV and D at an E c of 0.6 eV; and by the novel defect pool model (DPM), introducing three differently charged defects. No dramatic difference in σph is observed for both recombination models: however. DPM is superior to CDM, in that a more realistic correlation energy of +0.2 eV can be applied and fine structure in σph vs. T can be achieved
Keywords
Ge-Si alloys; amorphous semiconductors; crystal defects; electron-hole recombination; elemental semiconductors; hydrogen; minority carriers; photoconductivity; silicon; solar cells; amorphous Si:H; amorphous SiGe:H; band tails; carrier transport; conventional defect model; extended states; low bandgap light; midgap state densities; novel defect pool model; photoconductivity; photoexcited carriers; recombination; solar cells; Amorphous silicon; Doping; Integrated circuit modeling; Interface states; Lighting; Photoconductivity; Photonic band gap; Photovoltaic cells; Probability distribution; Tail;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
Conference_Location
Kissimmee, FL
Type
conf
DOI
10.1109/PVSC.1990.111868
Filename
111868
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