DocumentCode :
2615009
Title :
Bulk photoconductivity of a-Ge:H films from spectral measurements
Author :
Pfleiderer, H. ; Schmeling, F. ; Kusian, W. ; Karg, F.H. ; Krühler, W.
Author_Institution :
Siemens Res. Lab., Munchen, Germany
fYear :
1990
fDate :
21-25 May 1990
Firstpage :
1579
Abstract :
The authors prepared a-Ge:H films with different thicknesses and measured their spectral photoconductivity, which was found to increase with both film thickness and light wavelength. As an explanation, reduced photoconductivity under the illuminated surface is assumed. The ημτ-product of a film is given by its photoconductivity measured between ohmic contacts and represents a property of the photoelectrons. A two-layer model ascribes different ημτ-products to a front layer of the film and to the rest of it, called the bulk layer. By fitting the two-layer model to the present experiments the authors find a front-layer thickness of 55 nm, a surface ημτ-product of 1×10-8 cm2/V, and a bulk-layer ημτ-product of 5×10-7 cm2 /V. The effective ημτ-product, determined under the assumption of a homogeneous film, approaches the bulk value when both film thickness and light wavelength reach a value of 1 μm. No light degradation of the a-Ge:H films is found
Keywords :
amorphous semiconductors; carrier density; carrier lifetime; carrier mobility; elemental semiconductors; germanium; hydrogen; photoconductivity; semiconductor thin films; Ge:H; amorphous semiconductor; concentration mobility lifetime products; films; ohmic contacts; spectral photoconductivity; two-layer model; Conductive films; Conductivity; Degradation; Glass; Optical films; Photoconductivity; Photovoltaic cells; Surface fitting; Thickness measurement; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
Conference_Location :
Kissimmee, FL
Type :
conf
DOI :
10.1109/PVSC.1990.111874
Filename :
111874
Link To Document :
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