Title :
Auto-Tuning of Downlink Power of LTE Femtocells Adaptive to Various Interference Conditions
Author :
Morita, Motoki ; Matsunaga, Yasuhiko ; Hamabe, Kojiro
Author_Institution :
Syst. Platforms Res. Labs., NEC Corp., Kawasaki, Japan
Abstract :
Femtocell base stations are required to set proper downlink transmit power under various building environment. Conventional power setting techniques use a fixed power offset over received power level of the strongest macrocell base station to expand indoor femtocell coverage along with mitigating the interference leakage to the outdoors. However, the power offset has not been adequately optimized for various interference conditions, leading to degradation of macrocell or femtocell throughput. We propose an auto-tuning scheme of the power offset adaptive to the various interference conditions such as size of buildings where femtocell mobile stations exist, and distance to a street where macrocell mobile stations exist. The proposed scheme automatically tune the power offset so that the femtocell throughput can increase while maintaining the macrocell throughput based on macrocell mobile stations´ interference detection reports and their totalization. According to the Long-Term Evolution system level simulations, the proposed scheme tuned the power offset to a proper level depending on various building conditions and can improve the throughput. If the power offset is commonly tuned among femtocells in macrocell, a newly deployed femtocell can employ a proper setting from the beginning of its operation.
Keywords :
Long Term Evolution; femtocellular radio; radiofrequency interference; LTE femtocells; Long Term Evolution; autotuning scheme; downlink transmit power; femtocell base stations; femtocell mobile stations; femtocell throughput; indoor femtocell coverage; interference detection; interference leakage; macrocell base station; macrocell mobile stations; macrocell throughput; power offset; Buildings; Femtocells; Interference; Macrocell networks; Servers; Throughput; Tuning;
Conference_Titel :
Vehicular Technology Conference (VTC Spring), 2012 IEEE 75th
Conference_Location :
Yokohama
Print_ISBN :
978-1-4673-0989-9
Electronic_ISBN :
1550-2252
DOI :
10.1109/VETECS.2012.6240273