Title :
Computer Guided Logic IC Fault Location
Author :
Rauwerdink, Jeffrey L.
Author_Institution :
Harris Semiconductor, Custom Integrated Circuits Division, P. O. Box 883, MI/S 52-010, Melbourne, FL 32901. Tel. (305) 729-5833
Abstract :
A new technique locates `stuck´ faults in semicustom logic ICs (integrated circuits) using a PC (printed circuit) board functional tester which has a guided-probe fault location capability. The IC CAD (computer aided design) database, database translator programs and a logic simulator are utilized to automate the fault site location process This technique is in use on a set of 15 gate arrays.
Keywords :
Circuit faults; Circuit testing; Databases; Design automation; Fault location; Integrated circuit testing; Logic circuits; Logic testing; Printed circuits; Programmable logic arrays;
Conference_Titel :
Reliability Physics Symposium, 1987. 25th Annual
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/IRPS.1987.362164
