Title :
Ranking and selection techniques with overlapping variance estimators
Author :
Healey, Christopher ; Goldsman, David ; Kim, Seong-Hee
Author_Institution :
Georgia Inst. of Technol., Atlanta
Abstract :
Some ranking and selection (R&S) procedures for steady- state simulation require an estimate of the asymptotic variance parameter of each system to guarantee a certain probability of correct selection. We show that the performance of such R&S procedures depends on the quality of the variance estimates that are used. In this paper, we study the performance of R&S procedures with two new variance estimators -overlapping area and overlapping Cramer-von Mises estimators- which show better long-run performance than other estimators previously used in R&S problems.
Keywords :
parameter estimation; probability; simulation; asymptotic variance parameter estimation; overlapping variance estimator; probability; ranking technique; selection technique; steady-state simulation; Convergence; Modeling; Parameter estimation; Personal communication networks; Sociotechnical systems; Steady-state; Systems engineering and theory;
Conference_Titel :
Simulation Conference, 2007 Winter
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1306-5
Electronic_ISBN :
978-1-4244-1306-5
DOI :
10.1109/WSC.2007.4419643