DocumentCode
2615577
Title
A Circular Output Protection Device using Bipolar Action
Author
Momodomi, Masaki ; Horiguchi, Fumio ; Ogura, Mitsugi ; Kozuka, Eiji
Author_Institution
VLSI Research Center, Toshiba Corporation, 1, Komukai Toshiba-cho, Saiwai-ku, Kawasaki, 210 Japan. (044)-511-2111
fYear
1987
fDate
31868
Firstpage
169
Lastpage
173
Abstract
This paper will cover ESD (Electrostatic Discharge) protection reliability in an 1.2 micron NMOS technology. Several OPDs (Output Protection Devices) were designed and measured in order to study the location of energy dissipation and the ability of energy absorption during ESD event. A new circular OPD using bipolar action is proposed as the most promising OPD. The high reliability of this OPD is also described.
Keywords
Aluminum; Circuit testing; Electrostatic discharge; Electrostatic measurements; Integrated circuit measurements; MOS devices; Protection; Threshold voltage; Variable structure systems; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1987. 25th Annual
Conference_Location
San Diego, CA, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1987.362174
Filename
4208708
Link To Document