DocumentCode :
2615610
Title :
A bayesian approach to analysis of limit standards
Author :
Creasey, Roy R., Jr. ; White, K. Preston, Jr.
Author_Institution :
Longwood Univ., Longwood
fYear :
2007
fDate :
9-12 Dec. 2007
Firstpage :
544
Lastpage :
552
Abstract :
Limit standards are probabilistic requirements or benchmarks regarding the proportion of replications conforming or not conforming to a desired threshold. Sample proportions resulting from the analysis of replications are known to be beta distributed. As a result, standard constructs for defining a confidence interval on such a proportion, based on critical points from the normal or Student´s t distribution, are increasingly inaccurate as the mean sample proportion approaches the limits of 0 or 1. We consider the Bayesian relationship between the beta and binomial distributions as the foundation for a sequential methodology in the analysis of limit standards. The benefits of using the beta distribution methodology are variance reduction, and smaller sample size (when compared to other analysis methodologies).
Keywords :
Bayes methods; binomial distribution; sampling methods; Bayesian approach; beta distribution; binomial distribution; limit standards; probabilistic requirements; sample proportion; Analysis of variance; Bayesian methods; Discrete event simulation; Educational institutions; Gaussian distribution; Random variables; Statistical analysis; Statistical distributions; Systems engineering and theory; Traffic control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference, 2007 Winter
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1306-5
Electronic_ISBN :
978-1-4244-1306-5
Type :
conf
DOI :
10.1109/WSC.2007.4419646
Filename :
4419646
Link To Document :
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