DocumentCode
2615610
Title
A bayesian approach to analysis of limit standards
Author
Creasey, Roy R., Jr. ; White, K. Preston, Jr.
Author_Institution
Longwood Univ., Longwood
fYear
2007
fDate
9-12 Dec. 2007
Firstpage
544
Lastpage
552
Abstract
Limit standards are probabilistic requirements or benchmarks regarding the proportion of replications conforming or not conforming to a desired threshold. Sample proportions resulting from the analysis of replications are known to be beta distributed. As a result, standard constructs for defining a confidence interval on such a proportion, based on critical points from the normal or Student´s t distribution, are increasingly inaccurate as the mean sample proportion approaches the limits of 0 or 1. We consider the Bayesian relationship between the beta and binomial distributions as the foundation for a sequential methodology in the analysis of limit standards. The benefits of using the beta distribution methodology are variance reduction, and smaller sample size (when compared to other analysis methodologies).
Keywords
Bayes methods; binomial distribution; sampling methods; Bayesian approach; beta distribution; binomial distribution; limit standards; probabilistic requirements; sample proportion; Analysis of variance; Bayesian methods; Discrete event simulation; Educational institutions; Gaussian distribution; Random variables; Statistical analysis; Statistical distributions; Systems engineering and theory; Traffic control;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference, 2007 Winter
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-1306-5
Electronic_ISBN
978-1-4244-1306-5
Type
conf
DOI
10.1109/WSC.2007.4419646
Filename
4419646
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