• DocumentCode
    2615610
  • Title

    A bayesian approach to analysis of limit standards

  • Author

    Creasey, Roy R., Jr. ; White, K. Preston, Jr.

  • Author_Institution
    Longwood Univ., Longwood
  • fYear
    2007
  • fDate
    9-12 Dec. 2007
  • Firstpage
    544
  • Lastpage
    552
  • Abstract
    Limit standards are probabilistic requirements or benchmarks regarding the proportion of replications conforming or not conforming to a desired threshold. Sample proportions resulting from the analysis of replications are known to be beta distributed. As a result, standard constructs for defining a confidence interval on such a proportion, based on critical points from the normal or Student´s t distribution, are increasingly inaccurate as the mean sample proportion approaches the limits of 0 or 1. We consider the Bayesian relationship between the beta and binomial distributions as the foundation for a sequential methodology in the analysis of limit standards. The benefits of using the beta distribution methodology are variance reduction, and smaller sample size (when compared to other analysis methodologies).
  • Keywords
    Bayes methods; binomial distribution; sampling methods; Bayesian approach; beta distribution; binomial distribution; limit standards; probabilistic requirements; sample proportion; Analysis of variance; Bayesian methods; Discrete event simulation; Educational institutions; Gaussian distribution; Random variables; Statistical analysis; Statistical distributions; Systems engineering and theory; Traffic control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2007 Winter
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1306-5
  • Electronic_ISBN
    978-1-4244-1306-5
  • Type

    conf

  • DOI
    10.1109/WSC.2007.4419646
  • Filename
    4419646