DocumentCode
2616521
Title
Growth properties of self-assembled InAs quantum dots on a thin tensile-strained layer
Author
Kim, Jin Soo ; Lee, Jin Hong ; Hong, Sung Ui ; Han, Won Seok ; Kwack, Ho-Sang ; Oh, Dae Kon
Author_Institution
Basic Res. Lab., Electron. & Telecommun. Res. Inst., Daejeon, South Korea
fYear
2003
fDate
10-12 Dec. 2003
Firstpage
221
Lastpage
222
Abstract
The introduction of a thin tensile-strained GaAs and In0.32 Ga0.68As right below the QD layer modulates the structural and optical properties of self-assembled InAs QDs embedded in an InAlGaAs matrix. The AFM images indicated that the average size of InAs QDs on GaAs/InAlGaAs is decreased compared to that without the thin GaAs layer, but ones on In0.32Ga0.68As/InAlGaAs are increased with more isotropic shape.
Keywords
III-V semiconductors; atomic force microscopy; gallium arsenide; photoluminescence; semiconductor quantum dots; semiconductor thin films; 293 to 298 K; AFM images; GaAs; GaAs layer; GaAs-InAlGaAs; growth properties; optical properties; photoluminescence spectra; self assembled InAs quantum dots; structural properties; thin tensile strained layer; Atomic force microscopy; Atomic measurements; Force measurement; Gallium arsenide; Indium phosphide; Optical buffering; Optical modulation; Photoluminescence; Quantum dots; US Department of Transportation;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium, 2003 International
Print_ISBN
0-7803-8139-4
Type
conf
DOI
10.1109/ISDRS.2003.1272070
Filename
1272070
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