DocumentCode :
2616667
Title :
Advances in silicon carbide (SiC) device processing and substrate fabrication for high power microwave and high temperature electronics
Author :
Driver, M.C. ; Hopkins, R.H. ; Brandt, C.D. ; Barrett, D.L. ; Burk, A.A. ; Clarke, R.C. ; Eldridge, G.W. ; Hobgood, H.M. ; McHugh, J.P. ; McMullin, P.G. ; Siergiej, R.R. ; Sriram, S.
Author_Institution :
Westinghouse Sci. & Technol. Center, Pittsburgh, PA, USA
fYear :
1993
fDate :
10-13 Oct. 1993
Firstpage :
19
Lastpage :
21
Abstract :
High-power density, temperature tolerant silicon carbide (SiC) electronics offer an exceptional opportunity to increase the performance and lower the cost of many existing and emerging military and commercial products. Surveillance and tactical radar systems, compact electric tank and aircraft engine controls, high reliability aviation electronics, and radiation resistance satellite components are some examples. Recent technology advances have brought this potential payoff closer to reality. These include the fabrication of a record-setting MESFET device with 12 dB gain at 2 GHz and 2 W/mm of power at 1 GHz and the world´s first 2-inch diameter high-resistivity SiC wafers for planar devices and low resistivity substrates for power devices. Vertical transistor structures have also been fabricated using both Schottky barrier and MOS gates.<>
Keywords :
crystal growth from vapour; electron beam lithography; microwave field effect transistors; microwave power transistors; polishing; power MESFET; power MOSFET; power field effect transistors; semiconductor growth; semiconductor materials; silicon compounds; static induction transistors; substrates; 1 GHz; 12 dB; 2 GHz; 2 in; MESFET device; MOS gates; Schottky barrier; SiC device processing; electron beam direct write processing; high power microwave electronics; high temperature electronics; high-resistivity; low resistivity substrates; material technology; planar devices; static induction transistor; substrate fabrication; temperature tolerant; vapour transport; vertical MOSFET; vertical transistor structures; wafer polishing; Aerospace electronics; Airborne radar; Aircraft propulsion; Control systems; Costs; Military aircraft; Silicon carbide; Spaceborne radar; Surveillance; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1993. Technical Digest 1993., 15th Annual
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-1393-3
Type :
conf
DOI :
10.1109/GAAS.1993.394508
Filename :
394508
Link To Document :
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