Title :
Piecewise polynomial models for MOSFET DC characteristics with continuous first order derivative
Author :
Jun, Young-Hyun ; Park, Song-Bai
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
Abstract :
Measured MOSFET DC characteristics show monotonically increasing smooth curves for given Vgs (gate-to-source voltage). The authors describe two methods of polynomial approximation to these curves with continuous first-order derivative δI ds/δVds, which is often required for convergence in the circuit simulation. The polynomial coefficients as a function of Vgs are determined to best fit the measured or theoretical curves, and used in calculating the value of Ids (drain-to-source current) as a function of V gs, Vds, and Vbs (bulk bias voltage) without any interpolation in actual circuit simulation. The required storage for the coefficients is minimal, the fitting is excellent, and the computational efficiency improves by a factor of up to eight over the SPICE simulation in the DC transfer curve generation
Keywords :
insulated gate field effect transistors; polynomials; semiconductor device models; DC characteristics; MOSFET; circuit simulation; computational efficiency; continuous first order derivative; convergence; piecewise polynomial models; polynomial approximation; Circuit simulation; Computational efficiency; Convergence; Current measurement; Curve fitting; Interpolation; MOSFET circuits; Polynomials; SPICE; Voltage;
Conference_Titel :
Circuits and Systems, 1988., IEEE International Symposium on
Conference_Location :
Espoo
DOI :
10.1109/ISCAS.1988.15471