Title :
A frequency domain sensitivity analysis of closed-loop multiconductor transmission lines
Author :
Rahal-Arabi, Tawfik ; Suarez-Gartner, Ricardo ; Rausch, Martin ; Lape, Kristine M.
Author_Institution :
Intel Corp., Hilsboro, OR, USA
Abstract :
A frequency domain technique for the optimization, sensitivity, and robustness analysis of a large high-speed lossy multiconductor transmission line networks in VLSI regimes is presented. The technique is used to demonstrate the superiority of closed-loop topologies in terms of their electrical performance. To demonstrate this superiority, the numerical frequency domain results are validated by independent time domain simulations and measurements
Keywords :
VLSI; circuit analysis computing; circuit optimisation; frequency-domain analysis; integrated circuit interconnections; integrated circuit packaging; network topology; sensitivity analysis; transmission line theory; VLSI; closed-loop multiconductor transmission lines; closed-loop topologies; electrical performance; frequency domain sensitivity analysis; interconnect topology; lossy network; numerical analysis; optimization; robustness; time domain simulations; Frequency domain analysis; Frequency measurement; Multiconductor transmission lines; Network topology; Propagation losses; Robustness; Sensitivity analysis; Time measurement; Transmission line measurements; Very large scale integration;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1993
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-1427-1
DOI :
10.1109/EPEP.1993.394556
