Title :
Integrated metal-semiconductor-relaxor microstrip lines for application up to 1 GHz
Author :
Fiallo, H. ; Dougherty, J.P. ; Jang, S.J. ; Newnham, R.E.
Author_Institution :
Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
Abstract :
Multilayer ferrite-high-K microstrip lines are investigated as small-sized, package-compatible low pass filters for applications up to 1 GHz. The results demonstrate that their frequency response can be tuned by adjusting the layer thickness ratio, the resistivity of the semiconductor layer, and the difference between the permittivity-permeability product of each layer
Keywords :
VHF filters; ferrite filters; ferroelectric thin films; frequency response; low-pass filters; microstrip filters; microstrip lines; 1 GHz; NiZnFe2O4-PbMgO3NbO3; NiZnFe2O4-PMN; frequency response; integrated metal-semiconductor-relaxor microstrip lines; layer thickness ratio; multilayer ferrite high-K microstrip lines; package-compatible low pass filters; permittivity-permeability product; resistivity; semiconductor layer; Attenuation; Dielectric materials; Magnetic materials; Magnetic semiconductors; Microstrip; Microwave integrated circuits; Niobium compounds; Packaging; Semiconductor materials; Testing;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1993
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-1427-1
DOI :
10.1109/EPEP.1993.394579
