Title :
The evolution of silicon-on-insulator MOSFETs
Author :
Colinge, Jean-Pierre
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
Abstract :
This paper deals with evolution of silicon-on-insulator MOSFET. In 1964 partially depleted devices fabricated on silicon-on-sapphire substrates was developed and was successfully used in numerous military and civilian applications and still used to realize commercial HF circuits in fully depleted CMOS. The first fully depleted SOI MOSFET was established in early 1980 with superior transconductance, current drive and subthreshold swing. Double-gate SOI MOSFET was established in 1984 with resemblance of the XMOS structure and good short-channel characteristics. Later vertical-channel MOSFET, triangular-wire SOI MOSFET and Δ-channel MOSFET was established. Practical implementation of planar double-gate MOSFET was observed in 1990. The evolution of SOI MOSFET seems ineluctable as high drive with short-channel immunity becomes a problem and can no longer be solved by classical approach.
Keywords :
MOSFET; elemental semiconductors; silicon-on-insulator; Δ-channel MOSFET; HF circuits; Si; civilian applications; double-gate SOI MOSFET; fully depleted SOI MOSFET; metal-oxide-semiconductor FET; military applications; planar double-gate MOSFET; silicon-on-insulator MOSFET; silicon-on-sapphire substrates; triangular-wire SOI MOSFET; vertical-channel MOSFET; CMOS technology; FinFETs; Hafnium; MOS devices; MOSFET circuits; Silicon on insulator technology; Substrates; Threshold voltage; Transconductance; Transistors;
Conference_Titel :
Semiconductor Device Research Symposium, 2003 International
Print_ISBN :
0-7803-8139-4
DOI :
10.1109/ISDRS.2003.1272131