DocumentCode :
2617796
Title :
A comprehensive approach for texture classification
Author :
Reddy, P. Ammi ; Murty, S. P R Chandra ; Reddy, E. Sreenivasa
Author_Institution :
Jawaharlal Nehru Technol. Univ., Kakinada, India
fYear :
2010
fDate :
10-13 May 2010
Firstpage :
610
Lastpage :
613
Abstract :
Classification of textures based on wavelet pattern analysis is one of the most effective methods in texture classification. However using all frequency sub-bands in decomposition for classification may increase time complexity of classification algorithms. To reduce the time complexity, sub-bands with high energy and entropy are selected for classification. Fractal dimension can be used to select such significant sub-bands for decomposition at each level. Further statistical features of these significant sub-bands are given to modified K-NN classifier for classification. This paper describes texture classification using sub-bands of wavelets based on fractal dimensions and their results are compared with the results of texture classification using conventional features and also with different classifiers. Success rate is very high and time complexity is also reduced to the order of O(n).
Keywords :
computational complexity; image classification; image texture; learning (artificial intelligence); statistical analysis; wavelet transforms; K-NN classifier; fractal dimension; texture classification; time complexity; wavelet pattern analysis; Computers; Image recognition; Weaving; Wool; Euclidean classifier; Haar wavelet; K-NN classifier; box counting; fractal dimension;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Sciences Signal Processing and their Applications (ISSPA), 2010 10th International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-7165-2
Type :
conf
DOI :
10.1109/ISSPA.2010.5605425
Filename :
5605425
Link To Document :
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