• DocumentCode
    2618308
  • Title

    Topological analysis of the power grid and mitigation strategies against cascading failures

  • Author

    Pahwa, S. ; Hodges, A. ; Scoglio, C. ; Wood, S.

  • Author_Institution
    Kansas State Univ., Manhattan, KS, USA
  • fYear
    2010
  • fDate
    5-8 April 2010
  • Firstpage
    272
  • Lastpage
    276
  • Abstract
    This paper presents a complex systems overview of a power grid network. In recent years, concerns about the robustness of the power grid have grown because of several cascading outages in different parts of the world. In this paper, cascading effect has been simulated on three different networks, the IEEE 300 bus test system, the IEEE 118 bus test system, and the WSCC 179 bus equivalent model. Power Degradation has been discussed as a measure to estimate the damage to the network, in terms of load loss and node loss. A network generator has been developed to generate graphs with characteristics similar to the IEEE standard networks and the generated graphs are then compared with the standard networks to show the effect of topology in determining the robustness of a power grid. Three mitigation strategies, Homogeneous Load Reduction, Targeted Range-Based Load Reduction, and Use of Distributed Renewable Sources in combination with Islanding, have been suggested. The Homogeneous Load Reduction is the simplest to implement but the Targeted Range-Based Load Reduction is the most effective strategy.
  • Keywords
    IEEE standards; distributed power generation; load regulation; power grids; power system faults; renewable energy sources; IEEE 118 bus test system; IEEE 300 bus test system; WSCC 179 bus equivalent model; cascading failure mitigation strategies; distributed renewable sources; homogeneous load reduction; islanding; power degradation; power grid network; targeted range-based load reduction; Cascading Effect; Mitigation Strategies; Node Loss; Power Degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems Conference, 2010 4th Annual IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-5882-0
  • Type

    conf

  • DOI
    10.1109/SYSTEMS.2010.5482329
  • Filename
    5482329