DocumentCode
2618547
Title
Orthogonal array approach to gradient based yield optimization
Author
Styblinski, M.A. ; Zhang, J.C.
Author_Institution
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fYear
1990
fDate
1-3 May 1990
Firstpage
424
Abstract
A method of yield gradient estimation is proposed. It is based on the orthogonal array approach to the design of experiments. The method is related to the G. Taguchi (1987) philosophy of off-line quality control but is much more efficient. The method is applied to stochastic approximation based parametric yield optimization. Several test and circuit examples are presented
Keywords
circuit CAD; optimisation; CAD; computer aided design; gradient based yield optimization; orthogonal array approach; parametric yield optimization; stochastic approximation; Circuit analysis; Circuit testing; Convolution; Design optimization; Manufacturing; Probability density function; Quality control; Smoothing methods; Stochastic processes; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location
New Orleans, LA
Type
conf
DOI
10.1109/ISCAS.1990.112068
Filename
112068
Link To Document