Title :
Orthogonal array approach to gradient based yield optimization
Author :
Styblinski, M.A. ; Zhang, J.C.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
A method of yield gradient estimation is proposed. It is based on the orthogonal array approach to the design of experiments. The method is related to the G. Taguchi (1987) philosophy of off-line quality control but is much more efficient. The method is applied to stochastic approximation based parametric yield optimization. Several test and circuit examples are presented
Keywords :
circuit CAD; optimisation; CAD; computer aided design; gradient based yield optimization; orthogonal array approach; parametric yield optimization; stochastic approximation; Circuit analysis; Circuit testing; Convolution; Design optimization; Manufacturing; Probability density function; Quality control; Smoothing methods; Stochastic processes; Yield estimation;
Conference_Titel :
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location :
New Orleans, LA
DOI :
10.1109/ISCAS.1990.112068
