• DocumentCode
    2618743
  • Title

    Photolithography area dispatching scheme for advanced technology in foundry fabs

  • Author

    Hsu, Kuang-Huan ; Lan, Chieh-Chin

  • Author_Institution
    Taiwan Semicond. Manuf. Co., Taiwan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    211
  • Lastpage
    216
  • Abstract
    As advanced IC manufacturing technology processes become more complex and critical, the photo process specifications must be tightened to meet the design targets. For ⩽0.25 μm processes, most photo stages are limited to a dedicated tool, or even the same stepper, to get better overlay control. Dealing with process constraints and balancing tool loading inside the photo area effectively is a major challenge for advanced technology dispatching. In this paper, a photo-dispatching scheme for advanced technology production management in foundry fabs is developed to handle on-line dispatching. The proposed dispatching scheme can be divided into three parts: wafer start dispatching; dedicated tool management; and shop floor dispatching. This dispatching scheme not only automatically assigns a proper tool to each lot to meet the dedicated tool constraint and balance the tool loading, but also integrates with the local dispatching system to assist with shop floor dispatching. The proposed dispatching scheme has been proved to be useful for advanced technology mass production by testing in TSMC fab3
  • Keywords
    dispatching; integrated circuit manufacture; integrated circuit testing; photolithography; position control; production control; production testing; 0.25 micron; IC manufacturing technology; IC technology; automatic lot tool assignment; critical processes; dedicated tool; dedicated tool constraint; dedicated tool management; design targets; dispatching; dispatching scheme; foundry fabs; local dispatching system integration; mass production; on-line dispatching; overlay control; photo area; photo process specifications; photo stages; photo-dispatching scheme; photolithography area dispatching scheme; process complexity; process constraints; production testing; shop floor dispatching; stepper; technology production management; tool loading; tool loading balancing; wafer start dispatching; Computer aided manufacturing; Dispatching; Foundries; Lithography; Manufacturing processes; Mass production; Operations research; Production management; Semiconductor device manufacture; Semiconductor device testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Technology Workshop, 2000
  • Conference_Location
    Hsinchu
  • Print_ISBN
    0-7803-6374-4
  • Type

    conf

  • DOI
    10.1109/SMTW.2000.883098
  • Filename
    883098