• DocumentCode
    2618773
  • Title

    Non-uniformity of temperature distribution in ballroom type cleanrooms with FFU systems

  • Author

    Tsai, Chun-Hung ; Wang, Chun-Min ; Lo, Wan-Chang

  • Author_Institution
    Electron. Res. & Services Organ., Ind. Technol. Res. Inst., Hsinchu, Taiwan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    230
  • Lastpage
    238
  • Abstract
    The demands of temperature deviation in the semiconductor industry mean that it is critical to ensure that the manufacturing environment is stable. However, the essential nonuniformity problems of temperature distribution in the cleanrooms, especially in ballroom type cleanrooms with fan filter unit (FFU) systems, are rarely noted. This paper aims to investigate the nonuniformity phenomena of temperature distributions in ballroom type cleanrooms with FFU systems. We analyse several factors that cause the temperature deviations and discuss how to control them. By measuring the temperature distributions in the cleanroom and the thermal boundary layer thickness of the various kinds of equipment, the temperature distribution nonuniformity problems in the cleanrooms can be understood and applied to control of the manufacturing environment in the cleanrooms
  • Keywords
    clean rooms; environmental engineering; filtration; integrated circuit manufacture; integrated circuit measurement; production testing; temperature control; temperature distribution; temperature measurement; FFU systems; ballroom type cleanrooms; cleanrooms; equipment thermal boundary layer thickness; fan filter unit systems; manufacturing environment control; manufacturing environment stability; semiconductor industry; temperature deviation; temperature deviation control; temperature deviations; temperature distribution; temperature distribution measurement; temperature distribution nonuniformity; Coils; Cooling; Electronics industry; Industrial electronics; Manufacturing industries; Semiconductor device manufacture; Temperature control; Temperature distribution; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Technology Workshop, 2000
  • Conference_Location
    Hsinchu
  • Print_ISBN
    0-7803-6374-4
  • Type

    conf

  • DOI
    10.1109/SMTW.2000.883100
  • Filename
    883100