DocumentCode
2618773
Title
Non-uniformity of temperature distribution in ballroom type cleanrooms with FFU systems
Author
Tsai, Chun-Hung ; Wang, Chun-Min ; Lo, Wan-Chang
Author_Institution
Electron. Res. & Services Organ., Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear
2000
fDate
2000
Firstpage
230
Lastpage
238
Abstract
The demands of temperature deviation in the semiconductor industry mean that it is critical to ensure that the manufacturing environment is stable. However, the essential nonuniformity problems of temperature distribution in the cleanrooms, especially in ballroom type cleanrooms with fan filter unit (FFU) systems, are rarely noted. This paper aims to investigate the nonuniformity phenomena of temperature distributions in ballroom type cleanrooms with FFU systems. We analyse several factors that cause the temperature deviations and discuss how to control them. By measuring the temperature distributions in the cleanroom and the thermal boundary layer thickness of the various kinds of equipment, the temperature distribution nonuniformity problems in the cleanrooms can be understood and applied to control of the manufacturing environment in the cleanrooms
Keywords
clean rooms; environmental engineering; filtration; integrated circuit manufacture; integrated circuit measurement; production testing; temperature control; temperature distribution; temperature measurement; FFU systems; ballroom type cleanrooms; cleanrooms; equipment thermal boundary layer thickness; fan filter unit systems; manufacturing environment control; manufacturing environment stability; semiconductor industry; temperature deviation; temperature deviation control; temperature deviations; temperature distribution; temperature distribution measurement; temperature distribution nonuniformity; Coils; Cooling; Electronics industry; Industrial electronics; Manufacturing industries; Semiconductor device manufacture; Temperature control; Temperature distribution; Temperature measurement; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Technology Workshop, 2000
Conference_Location
Hsinchu
Print_ISBN
0-7803-6374-4
Type
conf
DOI
10.1109/SMTW.2000.883100
Filename
883100
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