• DocumentCode
    2619537
  • Title

    Verification of fields applied to an EUT in a reverberation chamber using statistical theory

  • Author

    Freyer, G.J. ; Lehman, T.H. ; Ladbury, J.M. ; Koepke, G.H. ; Hatfield, M.O.

  • Author_Institution
    NCEE, Monument, CO, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    24-28 Aug 1998
  • Firstpage
    34
  • Abstract
    Among the significant characteristics of the electromagnetic environment in a reverberation chamber are isotropy and homogeneity. These characteristics permit robust immunity testing without moving the equipment-under-test or the field generating antenna. However, the statistical nature of the electromagnetic environment gives rise to questions about the ability to predict the test fields at the equipment-under-test. The first issue is the ability to predict and/or establish the maximum test field. The second issue is the ability to predict the field at the equipment-undertest based on a measurement at the monitor antenna/probe location which is in the working volume but remote from the equipment-under-test. This paper extends the comparison of experimental data and the maximum to mean ratio predicted from statistical theory. The paper also compares measured data to theoretical predictions for the maximum field at arbitrary locations within a reverberation chamber based on a measurement of the mean field at the monitor location
  • Keywords
    electromagnetic compatibility; electromagnetic fields; electromagnetic interference; reverberation chambers; statistical analysis; testing; EMC; EUT; electromagnetic environment; equipment-under-test; field generating antenna; maximum to mean ratio; reverberation chamber; robust immunity testing; statistical theory; Antenna measurements; Character generation; Electromagnetic fields; Electromagnetic measurements; Immunity testing; Probes; Remote monitoring; Reverberation chamber; Robustness; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-5015-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1998.750056
  • Filename
    750056