• DocumentCode
    2619616
  • Title

    The frequency-temperature analysis equations of piezo electric plates with Lee plate theory

  • Author

    Wang, Ji

  • Author_Institution
    Epson Palo Alto Lab., CA, USA
  • fYear
    1997
  • fDate
    28-30 May 1997
  • Firstpage
    677
  • Lastpage
    681
  • Abstract
    Frequency-temperature analysis theory of crystal plates based on incremental field theory and Mindlin plate theory has been widely used in the vibration behavior analysis of crystal resonators for both analytical solutions and numerical approximations. As one of the two major plate theories for resonator analysis, Lee plate theory based on trigonometric series expansion of displacements has also been extensively used for both analytical and numerical analyses of quartz resonators, and efforts have also been made in correcting and perfecting the theory for much broader applications. In this paper, the earlier frequency-temperature relations based on the incremental field theory is further extended to the trigonometric series expansion in a systematic manner. By incorporating the frequency-temperature relations into Lee plate theory, the complete analysis of crystal resonators can be made in a more consistent way. The thickness-shear and flexural vibration equations have been compared with the previous power series theory to demonstrate the similarity and consistency
  • Keywords
    crystal resonators; quartz; series (mathematics); Lee plate theory; crystal resonators; flexural vibration equations; frequency-temperature analysis equations; frequency-temperature relations; incremental field theory; piezo electric plates; power series theory; quartz resonators; resonator analysis; thickness-shear equations; trigonometric series expansion; vibration behavior analysis; Capacitive sensors; Elasticity; Equations; Frequency; Laboratories; Numerical analysis; Temperature; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1997., Proceedings of the 1997 IEEE International
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-3728-X
  • Type

    conf

  • DOI
    10.1109/FREQ.1997.638757
  • Filename
    638757