Title :
Third overtone frequency turn-over temperature characteristics vs. orientations for quartz resonators vibrating in thickness-shear B-mode
Author :
NAKAZAWA, Mitsuo ; Yamazaki, Hideki ; Takeuchi, Makoto
Author_Institution :
Shinshu Univ., Nagano, Japan
Abstract :
To conduct a theoretical analysis regarding precise prediction of frequency turn-over temperature (FTT) of the third overtone mode vibrating in thickness-shear B mode, in the vicinity of BT-cut resonator, measurements were conducted by the oscillation method, over a wide temperature range from -196 to 100°C and compared with the fundamental FTT. The precise quadric relationships between the FTT and the crystallo-graphic orientation were obtained theoretically for the fundamental- and the third-overtone thickness-shear B-modes, respectively, and the coefficients of quadrics were determined experimentally by the least squares method. It was found that there were the new resonators having a small temperature dependence of cubic curve in the vicinity of -100°C, in the region of the angels of cuts -51.5 to -53°. The important relationships between the quadric coefficients and the first-, second- and third-order frequency temperature coefficients for the third overtone mode were also obtained and compared with those for the fundamental waves vibrating in thickness-shear B-mode
Keywords :
crystal orientation; crystal resonators; frequency stability; least squares approximations; quartz; vibrations; -196 to 100 C; BT-cut resonator; LS method; SiO2; crystallographic orientation; frequency temperature coefficients; frequency turn-over temperature characteristics; fundamental-mode; least squares method; oscillation method; quadric coefficients; quartz resonators; temperature dependence; thickness-shear B-mode; third overtone mode; wide temperature range; Crystallography; Frequency measurement; Harmonic analysis; Least squares methods; Reliability theory; Resonant frequency; Temperature dependence; Temperature distribution; Thickness measurement; Vibration measurement;
Conference_Titel :
Frequency Control Symposium, 1997., Proceedings of the 1997 IEEE International
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3728-X
DOI :
10.1109/FREQ.1997.638771