• DocumentCode
    2620120
  • Title

    Development and characterisation of micrometer sized polymer particles with extremely narrow size distribution

  • Author

    Kristiansen, H. ; Redford, K. ; Zhang, Z. ; Hee, J. ; Fleissner, M. ; Dahl, P.I.

  • Author_Institution
    Conpart AS, USA
  • fYear
    2007
  • fDate
    3-5 Oct. 2007
  • Firstpage
    135
  • Lastpage
    139
  • Abstract
    This paper describes size characterisation and mechanical characterisation of micrometer sized polymer particles with an extremely narrow size distribution. Typical applications for this type of particles are as conductive particles (plated with metal) in Anisotropic Conductive Films (ACF) or as spacers for LCD or chip stacking. A number of different instruments and techniques have been investigated to be able to measure size, size distribution and frequency of “off-sized” particles. Due to very tight specifications, none of the instruments were able to provide the full set of information needed, and a combination of different techniques is needed. Also greatly improved technique for mechanical characterisation of such polymer particles are reported in this paper. Adapting a commercial Nano-Indenter and optimising sample preparation and testing procedure have obtained very reproducible and consistent results.
  • Keywords
    Anisotropic conductive films; Chemistry; Conducting materials; Frequency measurement; Instruments; Manufacturing processes; Mechanical factors; Particle measurements; Polymers; Stacking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties, and Interfaces, 2007. APM 2007. 12th International Symposium on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1550-5723
  • Print_ISBN
    978-1-4244-1338-6
  • Electronic_ISBN
    1550-5723
  • Type

    conf

  • DOI
    10.1109/ISAPM.2007.4419931
  • Filename
    4419931