DocumentCode :
2620171
Title :
A model for impact dynamics and its application to frequency analysis of tapping-mode atomic force microscopes
Author :
Materassi, D. ; Basso, M. ; Genesio, R.
Author_Institution :
Dipt. di Sistemi e Informatica, Firenze Univ., Italy
Volume :
6
fYear :
2003
fDate :
9-12 Dec. 2003
Firstpage :
6218
Abstract :
The problem of two-body impact dynamics is considered providing a general class of models based on hysteresis functions. The structure of the model and its flexibility allows for a direct application of harmonic balance techniques for the analysis of periodic impacts when the forces involved are repulsive, repulsive-attractive and dissipative. An application to the oscillation analysis of a tapping-mode atomic force microscope (AFM) provides useful analytical results, which give a qualitative explanation of a number of known experimental phenomena.
Keywords :
atomic force microscopy; frequency-domain analysis; hysteresis; impact (mechanical); dissipative force; frequency analysis; hysteresis functions; repulsive force; repulsive-attractive force; tapping-mode atomic force microscope; two-body impact dynamics; Atomic force microscopy; Energy loss; Frequency; Harmonic analysis; Hysteresis; Periodic structures; Power system harmonics; Power system modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 2003. Proceedings. 42nd IEEE Conference on
ISSN :
0191-2216
Print_ISBN :
0-7803-7924-1
Type :
conf
DOI :
10.1109/CDC.2003.1272277
Filename :
1272277
Link To Document :
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