Title :
Crack tip behavior under pulsed electromagnetic loading
Author :
Satapathy, Sikhanda ; Stefani, Francis ; Saenz, Aaron
Author_Institution :
Inst. for Adv. Technol., Univ. of Texas, Austin, TX, USA
Abstract :
This paper describes a series of experiments and their numerical simulations in which cracks were created in conductors by using high-transient magnetic fields. The tests were conducted on small samples of 7075 aluminum alloy in a test fixture that placed the samples in series with a high-voltage capacitor bank and constrained the samples from moving. Notches were machined in the samples at various depths for the purpose of creating an initiation site for the cracks. After each pulse, the samples were unmounted and examined under an optical microscope. The peak current was varied to examine its effect on crack tip behavior. It was found that the crack tip extended linearly, was blunted by cavitation (blowholes formed due to high heating), or bifurcated-depending on the level of the peak current. Multiple pulses were also applied to one sample to study the effects of repeated pulsing on crack extension. Finite element computations were performed using the 3D Finite element analysis program EMAP3D in conjunction with the stress code DYNA3D. The computational results confirm most of the features observed in the experiments.
Keywords :
aluminium alloys; bifurcation; capacitor storage; cavitation; conductors (electric); crack detection; electromagnetic fields; electromagnetic pulse; finite element analysis; optical microscopes; 3D finite element analysis program; DYNA3D; EMAP3D; aluminum alloy; cavitation; conductor cracks; crack bifurcation; crack extension; crack tip heating; crack tip propagation; finite element computations; high-transient magnetic fields; high-voltage capacitor bank; numerical simulations; optical microscope; pulsed electromagnetic loading; stress code; Aluminum alloys; Conductors; EMP radiation effects; Finite element methods; Fixtures; Magnetic fields; Numerical simulation; Optical microscopy; Optical pulses; Testing;
Conference_Titel :
Electromagnetic Launch Technology, 2004. 2004 12th Symposium on
Print_ISBN :
0-7803-8290-0
DOI :
10.1109/ELT.2004.1398056