A Compton-scattering coincidence system for light yield measurements on aliovalently-doped CeBr3

A Compton-coincidence scintillator light yield proportionality measurement system was constructed and tested. Improved testing procedures and timing resolution have allowed the use of significantly less active excitation sources without lengthening test times or degrading data integrity. Previous methods typically required 100μCi ¹³⁷Cs sources, but an increase in solid angle between source and sample as well as improved timing resolution have allowed the use of sources with activities less than 10μCi. Representative samples of BGO and NaI(Tl) were tested to validate the system against single source data in the literature. Light yield from an in-house grown, doped CeBr3 sample was also measured.