Title :
5.7 A graphics execution core in 22nm CMOS featuring adaptive clocking, selective boosting and state-retentive sleep
Author :
Tokunaga, Carlos ; Ryan, Joseph F. ; Augustine, Charles ; Kulkarni, Jaydeep P. ; Yi-Chun Shih ; Kim, Stephen T. ; Jain, R. ; Bowman, Keith ; Raychowdhury, Arijit ; Khellah, Muhammad M. ; Tschanz, James W. ; De, Vivek
Author_Institution :
Intel, Hillsboro, OR, USA
Abstract :
In this paper, we present a low-power graphics processing core that achieves a 40% improvement in peak energy efficiency using dual-VCC arrays, adaptive clocking for voltage droop mitigation, and state retention capability with an integrated retention clamping circuit for low-power sleep mode. The 22nm testchip includes a graphics execution core connected to an SRAM array and test controller used for storage and delivery of at-speed test vectors. Correct execution of the tests is validated through a multiple-input signature register (MISR), which accumulates key signals in the core and generates a 32b signature at test completion.
Keywords :
CMOS digital integrated circuits; SRAM chips; graphics processing units; integrated circuit testing; low-power electronics; CMOS; SRAM array; adaptive clocking; dual-VCC arrays; graphics execution core; integrated retention clamping circuit; low-power graphics processing core; low-power sleep mode; multiple-input signature register; selective boosting; size 22 nm; state-retentive sleep; voltage droop mitigation; Clamps; Clocks; Energy efficiency; Graphics; Logic gates; Low voltage; Read only memory;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757359