DocumentCode
262117
Title
7.4 A 413×240-pixel sub-centimeter resolution Time-of-Flight CMOS image sensor with in-pixel background canceling using lateral-electric-field charge modulators
Author
Sang-Man Han ; Takasawa, Taishi ; Akahori, Tomoyuki ; Yasutomi, Keita ; Kagawa, Keiichiro ; Kawahito, S.
Author_Institution
Shizuoka Univ., Hamamatsu, Japan
fYear
2014
fDate
9-13 Feb. 2014
Firstpage
130
Lastpage
131
Abstract
Time-of-Flight (ToF) range imagers have a wide range of applications, such as 3D mice, gesture-based remote controllers, amusement, robots, security systems, and automobiles. Numerous ToF range imager developments have been reported [1-4]. Recent developments are often based on CMOS image sensor technology with pinned photodiode options [5-7], which are suitable for cost-effective mass production. Reported CMOS ToF range imagers use single-tap or two-tap lock-in pixels; to cancel the influence of background light, two or four sub-frames are used to produce a background-canceled range image. These architectures, however, have difficulty with precise range measurements of moving objects, because background light cancelation is not guaranteed for moving objects. Lock-in pixels without any charge-draining gate suffer from background light during the readout time of the operation. Another important issue with CMOS ToF range imagers for high range resolution is the speed of lock-in pixels, which must be improved to use high-modulation-frequency light or short-duration light pulses.
Keywords
CMOS image sensors; photodiodes; 3D mice; CMOS image sensor technology; amusement; automobiles; background light cancelation; background-canceled range image; charge-draining gate; cost-effective mass production; gesture-based remote controllers; high-modulation-frequency light pulses; in-pixel background canceling; lateral-electric-field charge modulators; lock-in pixels; moving objects range measurements; photodiode; range imager developments; robots; security systems; short-duration light pulses; time-of-flight CMOS image sensor; time-of-flight range imagers; CMOS image sensors; CMOS integrated circuits; Electric fields; Image resolution; Logic gates; Modulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
978-1-4799-0918-6
Type
conf
DOI
10.1109/ISSCC.2014.6757368
Filename
6757368
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