DocumentCode :
2621511
Title :
SiGe nanostructures
Author :
Vescan, L. ; Goryll, M. ; Grimm, K. ; Dieker, C. ; Stoica, T.
Author_Institution :
Inst. fur Schicht- und Ionentech., Forschungszentrum Julich GmbH, Germany
fYear :
1998
fDate :
18-18 Sept. 1998
Firstpage :
38
Lastpage :
46
Abstract :
There is increasing interest in Si-based optoelectronics using Si/sub 1-x/Ge/sub x/ nanostructures due to the possibility of their integration with the Si technology. To overcome the problem of the indirect character of SiGe one is looking for means to increase the transition probability by realizing structures involving quantum size effects. Several fabrication strategies for semiconductor nanostructures have been proposed. One possible approach involves selective epitaxy to fill-in the small holes in patterned substrates. To realize the lateral confinement below 100 nm the patterned substrates are made either by e-beam lithography or by optical lithography. In the latter case, the sub-100 nm confinement is realized by the development of facets. Another approach for nanostructures is based on self-organized growth which leads to island formation in highly lattice-mismatched layers. In this paper these items are discussed for SiGe as well as device applications such as light emitting diodes. The growth technique used was low pressure chemical vapor deposition.
Keywords :
Ge-Si alloys; electron beam lithography; light emitting diodes; nanotechnology; optoelectronic devices; photolithography; semiconductor growth; semiconductor materials; vapour phase epitaxial growth; 100 nm; Si-based optoelectronics; Si/sub 1-x/Ge/sub x/; SiGe; SiGe nanostructures; chemical vapor deposition; device applications; e-beam lithography; fabrication strategies; facets; growth technique; highly lattice-mismatched layers; island formation; lateral confinement; light emitting diodes; low pressure CVD; optical lithography; patterned substrates; quantum size effects; selective epitaxy; self-organized growth; semiconductor nanostructures; transition probability; Chemical vapor deposition; Epitaxial growth; Germanium silicon alloys; Hydrogen; Inductors; Lithography; Nanostructures; Silicon germanium; Substrates; Water pollution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 1998. Digest of Papers. 1998 Topical Meeting on
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-5288-2
Type :
conf
DOI :
10.1109/SMIC.1998.750173
Filename :
750173
Link To Document :
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