DocumentCode :
2621821
Title :
Testability modeling and analysis based on rough set
Author :
Su, Xuejun ; Wang, Chenggang ; Cai, Shichuang
Author_Institution :
Dept. of Basic Exp., Naval Aeronaut. & Astronaut. Univ., Yantai, China
fYear :
2011
fDate :
27-29 June 2011
Firstpage :
2653
Lastpage :
2656
Abstract :
Aiming at the limitation of dependency model in description and analysis of uncertain problem for testability analysis of complex circuit board, a testability modeling and analysis method is put forward based on fault simulation and rough set. Firstly, an information system is generated through fault simulation. Then, decision table matrix is provided by conditional attributes discretization and reduction. And moreover, the fault detection rate and fault isolation rate of circuit board can be calculated based on the matrix. Finally, an example proves that our method is feasible and effective.
Keywords :
analogue circuits; data reduction; design for testability; fault location; fault simulation; integrated circuit testing; matrix algebra; printed circuit testing; rough set theory; attributes reduction; complex circuit board; conditional attributes discretization; fault detection rate; fault isolation rate; fault simulation; information system; matrix; rough set theory; testability analysis; testability modeling; Analog circuits; Analytical models; Circuit faults; Information systems; Integrated circuit modeling; Printed circuits; Transmission line matrix methods; fault simulation; rough set; testability analysis; testability modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Science and Service System (CSSS), 2011 International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-9762-1
Type :
conf
DOI :
10.1109/CSSS.2011.5974752
Filename :
5974752
Link To Document :
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