DocumentCode
2621926
Title
Optical properties of III nitrides grown by reactive MBE
Author
Morkoç, H.
fYear
1996
fDate
8-11 Dec 1996
Firstpage
365
Lastpage
373
Abstract
Properties of GaN and GaN/AlGaN structures deposited by reactive MBE where the reactive nitrogen source is provided by thermal disassociation of ammonia on the substrate surface. Bulk GaN layers with excellent excitonic transitions on sapphire, GaN buffer layers deposited by MOCVD, and ZnO substrates have been obtained. So have the GaN/AlGaN separate confinement heterostructures exhibiting optical pumping threshold powers of under 90 kW/cm2 diode along with DH AlGaN/GaN LEDs. Recently, pin diode UV detectors exhibiting what appears to be excitonic response at room temperature with a sensitivity of about 0.1 A/W near the band edge have been obtained
Keywords
III-V semiconductors; aluminium compounds; excitons; gallium compounds; molecular beam epitaxial growth; photoluminescence; semiconductor epitaxial layers; semiconductor growth; DH LED; GaN; GaN buffer layer; GaN-AlGaN; III nitride; ZnO substrate; excitonic transitions; optical properties; optical pumping; pin diode UV detector; reactive MBE growth; sapphire substrate; separate confinement heterostructure laser; Aluminum gallium nitride; Buffer layers; Diodes; Gallium nitride; MOCVD; Nitrogen; Optical buffering; Optical pumping; Optical sensors; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials And Devices Proceedings, 1996 Conference on
Conference_Location
Canberra, ACT
Print_ISBN
0-7803-3374-8
Type
conf
DOI
10.1109/COMMAD.1996.610146
Filename
610146
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