Title :
11.4 A 1.5mW 68dB SNDR 80MS/s 2× interleaved SAR-assisted pipelined ADC in 28nm CMOS
Author :
van der Goes, Frank ; Ward, Chris ; Astgimath, Santosh ; Yan, Heng-Chao ; Riley, Jeff ; Mulder, John ; Wang, Shuhui ; Bult, Klaas
Author_Institution :
Broadcom, Bunnik, Netherlands
Abstract :
The resolution and sampling speed of recently reported SAR ADCs have increased to 11+ ENOB at 50 to 100MS/s [1,2]; however, power efficiency has unfortunately suffered when compared to lower-resolution, lower-speed ADCs. This design targets the same high speed and resolution while simultaneously achieving power efficiency previously associated only with low-speed, low-resolution ADCs. Furthermore, the power reported includes the consumption from the active reference generator, clock generator and encoder (since this is an industrial SoC), differentiating it from the majority of reported SAR ADCs. A dynamic residue amplifier with excellent noise-filtering properties, embedded in a pipelined architecture, is a key power-saving technique. In addition, an energy-efficient switched-capacitor (SC) DAC is obtained by using a small fraction of the total DAC capacitance during the initial SAR steps. The realized Walden FOM is 9.1fJ/conv-step while the Schreier FoM is 172.3dB, currently the highest reported number to date for sampling speeds greater than 0.1Ms/s, based on the extensive list of recent data converters compiled in [3].
Keywords :
CMOS integrated circuits; analogue-digital conversion; digital-analogue conversion; flip-flops; CMOS; SNDR; Schreier FoM; SoC; Walden FOM; active reference generator; clock generator; data converters; dynamic residue amplifier; encoder; interleaved SAR-assisted pipelined ADC; noise-filtering; pipelined architecture; power 1.5 mW; power efficiency; power-saving technique; size 28 nm; successive approximation register; switched-capacitor DAC; CMOS integrated circuits; Capacitors; Noise; Switches; System-on-chip; Transistors;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757399