• DocumentCode
    2622265
  • Title

    Double sampling in switched-capacitor delta-sigma A/D converters

  • Author

    Hurst, Paul J. ; McIntyre, W.J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Davis, CA, USA
  • fYear
    1990
  • fDate
    1-3 May 1990
  • Firstpage
    902
  • Abstract
    The achievable signal-to-noise ratio is switched-capacitor delta-sigma modulation analog-to-digital converters is set by the oversampling clock frequency divided by twice the signal bandwidth. The use of double sampling in the switched-capacitor integrators to achieve a factor of two increase in the oversampling factor without reducing the settling time of the operational amplifier is proposed. Detailed simulations have shown that for sufficiently small capacitor mismatch, the double-sampling schemes provide a significant increase in SNR. The larger the desired SNR, the more sensitive the circuit is to capacitor mismatch. It is concluded that the random gain implementation is preferred over the alternating gain scheme, because the former spectrally spreads the effect of the capacitor mismatch
  • Keywords
    analogue-digital conversion; delta modulation; integrating circuits; switched capacitor networks; SNR; capacitor mismatch; double sampling; operational amplifier; oversampling clock frequency; random gain implementation; settling time; signal bandwidth; signal-to-noise ratio; switched-capacitor delta-sigma A/D converters; switched-capacitor integrators; Analog-digital conversion; Bandwidth; Capacitors; Clocks; Delta-sigma modulation; Frequency conversion; Operational amplifiers; Sampling methods; Signal to noise ratio; Switching converters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1990., IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Type

    conf

  • DOI
    10.1109/ISCAS.1990.112238
  • Filename
    112238