DocumentCode
2622265
Title
Double sampling in switched-capacitor delta-sigma A/D converters
Author
Hurst, Paul J. ; McIntyre, W.J.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., California Univ., Davis, CA, USA
fYear
1990
fDate
1-3 May 1990
Firstpage
902
Abstract
The achievable signal-to-noise ratio is switched-capacitor delta-sigma modulation analog-to-digital converters is set by the oversampling clock frequency divided by twice the signal bandwidth. The use of double sampling in the switched-capacitor integrators to achieve a factor of two increase in the oversampling factor without reducing the settling time of the operational amplifier is proposed. Detailed simulations have shown that for sufficiently small capacitor mismatch, the double-sampling schemes provide a significant increase in SNR. The larger the desired SNR, the more sensitive the circuit is to capacitor mismatch. It is concluded that the random gain implementation is preferred over the alternating gain scheme, because the former spectrally spreads the effect of the capacitor mismatch
Keywords
analogue-digital conversion; delta modulation; integrating circuits; switched capacitor networks; SNR; capacitor mismatch; double sampling; operational amplifier; oversampling clock frequency; random gain implementation; settling time; signal bandwidth; signal-to-noise ratio; switched-capacitor delta-sigma A/D converters; switched-capacitor integrators; Analog-digital conversion; Bandwidth; Capacitors; Clocks; Delta-sigma modulation; Frequency conversion; Operational amplifiers; Sampling methods; Signal to noise ratio; Switching converters;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location
New Orleans, LA
Type
conf
DOI
10.1109/ISCAS.1990.112238
Filename
112238
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