• DocumentCode
    2622482
  • Title

    Development of APD measuring equipment and its faculty

  • Author

    Uchino, Masaharu ; Shinozuka, Takashi ; Sat, Risaburo

  • Author_Institution
    ElectroMagnetic Compatibility Res. Labs. Co. Ltd., Yoshinari, Japan
  • Volume
    2
  • fYear
    1998
  • fDate
    24-28 Aug 1998
  • Firstpage
    739
  • Abstract
    Amplitude probability distribution (APD) measuring equipment has been developed that can measure amplitude distribution semi-continuously. Two sets of this equipment at resolution bandwidths of 100 MHz and 1 MHz were used to make simultaneous APD measurements of electromagnetic disturbance leaking from a microwave oven. On comparing the results of both measurements, it was found that measurements made at a resolution bandwidth of 100 MHz were superior in terms of repeatability. In addition, simultaneous measurements were performed by the weighting method proposed by CISPR (at a video bandwidth of 10 Hz) and by APD measurements at a video bandwidth of 3 MHz. Based on the average value obtained from the latter measurements, a method is proposed to evaluate such leaking disturbance, and this method is compared with the results of the former measurements
  • Keywords
    electric field measurement; electromagnetic interference; magnetic field measurement; microwave heating; ovens; probability; test equipment; CISPR; ProdeF; amplitude distribution measurement; amplitude probability distribution; electromagnetic disturbance leak; envelope sampling method; leaking EM disturbance; microwave oven; resolution bandwidth; resolution bandwidths; video bandwidth; weighting method; Bandwidth; Bit error rate; Digital communication; Electromagnetic measurements; Frequency; Integrated circuit measurements; Interference; Performance evaluation; Quadratic programming; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-5015-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1998.750291
  • Filename
    750291