Title :
13.7 A reconfigurable sense amplifier with auto-zero calibration and pre-amplification in 28nm CMOS
Author :
Giridhar, B. ; Pinckney, N. ; Sylvester, Dennis ; Blaauw, D.
Author_Institution :
Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
This work presents an area-efficient and variation-tolerant small-signal differential sensing (VTS) scheme that modifies the conventional SA circuit to include: 1) a structure for on-the-fly, auto-zeroing offset compensation, 2) pre-amplification of bitline differential by reconfiguring the SA inverter pair as amplifiers, and 3) latching of the amplified voltage differential by returning the SA to its conventional cross-coupled configuration. The approach is demonstrated to improve SA robustness over conventional sensing at isosensing time without area overhead (Fig. 13.7.1). Conversely, sensing time can be reduced at iso-robustness and area. Measurements of a 28nm CMOS test chip show that an iso-area VTS scheme improves offset noise tolerance by -1.2σVth or sensing speed by up to 42% at iso-robustness (<;0.3% failure rate).
Keywords :
CMOS integrated circuits; amplification; differential amplifiers; preamplifiers; CMOS test chip; SA circuit; SA inverter; amplified voltage differential latching; auto-zero calibration; autozeroing offset compensation; bitline differential pre-amplification; cross-coupled configuration; iso-area VTS scheme; offset noise tolerance; reconfigurable sense amplifier; size 28 nm; variation-tolerant small-signal differential sensing scheme; CMOS integrated circuits; Capacitors; Inverters; Method of moments; Random access memory; Robustness; Sensors;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757418