Damage to magnetic recording heads due to electromagnetic interference

Author

Wallash, Albert ; Smith, Doug

Author_Institution

Quantum Corp., Milpitas, CA, USA

Volume

2

fYear

1998

fDate

24-28 Aug 1998

Firstpage

834

Abstract

The effect of electromagnetic interference (EMI) on giant magnetoresistive (GMR) recording heads is studied for the first time. It is shown that a GMR head connected to test equipment can be physically and/or magnetically damaged by a remote ESD event or other spark that causes radiated EMI. SEM failure analysis shows severe melting of the thin film GMR sensor. It is concluded that it is important to understand, measure and prevent EMI damage to GMR recording heads, and that EMI testing has revealed a new and important failure mechanism for magnetic recording sensors

Keywords

electric sensing devices; electromagnetic interference; electrostatic discharge; failure analysis; magnetic heads; magnetoresistive devices; scanning electron microscopy; sparks; thin film devices; EMI; EMI damage measurement; EMI damage prevention; SEM failure analysis; electromagnetic interference; failure mechanism; magnetic recording heads damage; magnetic recording sensors; magnetoresistive recording heads; radiated EMI; remote ESD event; spark; test equipment; thin film GMR sensor; Electromagnetic interference; Electromagnetic radiation; Failure analysis; Giant magnetoresistance; Magnetic devices; Magnetic heads; Magnetic recording; Magnetic sensors; Test equipment; Thin film sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on

Conference_Location

Denver, CO

Print_ISBN

0-7803-5015-4

Type

conf

DOI

10.1109/ISEMC.1998.750315

Filename

750315