Title :
The RTES project - BTeV, and beyond
Author :
Haney, Michael J. ; Ahuja, Shikha ; Bapty, Ted ; Cheung, Harry ; Kalbarczyk, Zbigniew ; Khanna, Akhilesh ; Kowalkowski, Jim ; Messie, Derek ; Mosse, Daniel ; Neema, Sandeep ; Nordstrom, Steve ; Oh, Jae ; Sheldon, Paul ; Shetty, Shweta ; Volper, Dmitri ; W
Author_Institution :
High Energy Phys., Illinois Univ., Urbana, IL
Abstract :
The real time embedded systems (RTES) project was created to study the design and implementation of high-performance, heterogeneous, and fault-adaptive real time embedded systems. The driving application for this research was the proposed BTeV high energy physics experiment, which called for large farms of embedded computational elements (DSPs), as well as a large farm of conventional high-performance processors to implement its Level 1 and Level 2/3 triggers. At the time of BTeV´s termination early in 2005, the RTES project was within days of completing a prototype implementation for providing a reliable and fault-adaptive infrastructure to the L2/3 farm; a prototype for the L1 farm had been completed in 2003. This paper documents the conclusion of the RTES focus on BTeV, and provides an evaluation of the applicability of the RTES concepts to other systems
Keywords :
embedded systems; high energy physics instrumentation computing; large-scale systems; reliability; trigger circuits; BTeV high energy physics experiment; DSP; Level 1 triggers; Level 2/3 triggers; RTES project; computer reliability; conventional high-performance processors; embedded computational elements; fault-adaptive infrastructure; fault-adaptive real time embedded systems; heterogeneous embedded systems; high-performance embedded systems; large-scale systems; real time embedded systems project; real time systems; reliability modeling; reliable infrastructure; Computer science; Domain specific languages; Embedded computing; Embedded system; Fault detection; Physics computing; Prototypes; Real time systems; Runtime; USA Councils;
Conference_Titel :
Real Time Conference, 2005. 14th IEEE-NPSS
Conference_Location :
Stockholm
Print_ISBN :
0-7803-9183-7
DOI :
10.1109/RTC.2005.1547464