Foreword

fYear

2009

fDate

25-29 May 2009

Abstract

Presents the welcome message from the conference proceedings.

Keywords

Circuit testing; Circuits and systems; Conferences; Councils; Electronic equipment testing; Europe; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2009 14th IEEE European

Conference_Location

Seville

Print_ISBN

978-0-7695-3703-0

Type

conf

DOI

10.1109/ETS.2009.4

Filename

5170444

Link To Document