The applications of fuzzy comprehensive evaluation to test programs analysis

Author

Ma, Yuhai ; Sun, Yihe ; Chen, Hongyi

Author_Institution

Inst. of Microelectron., Tsinghua Univ., Beijing, China

fYear

1997

fDate

21-24 Sep 1997

Firstpage

406

Lastpage

411

Abstract

This paper presents an approach to support analysis and debugging of VLSI device test programs. In research into the previous work, we find that there are two restrictions in program debugging: computational complexity and diagnostic precision, which greatly influence the effect of program debugging. In the paper, we apply Fuzzy Mathematics, especially Fuzzy Comprehensive Evaluation, to research on fuzzy knowledge representation, fuzzy relation, and fuzzy inference, etc. in the test programs analysis. An algorithm for the selection of the test entities to be debugged is addressed

Keywords

VLSI; computational complexity; fuzzy set theory; integrated circuit testing; knowledge representation; program debugging; VLSI device test programs; computational complexity; diagnostic precision; fuzzy comprehensive evaluation; fuzzy inference; fuzzy knowledge representation; fuzzy mathematics; fuzzy relation; program debugging; test programs analysis; Algorithms; Computational complexity; Debugging; Fuzzy set theory; Fuzzy systems; Humans; Mathematical model; Mathematics; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Fuzzy Information Processing Society, 1997. NAFIPS '97., 1997 Annual Meeting of the North American

Conference_Location

Syracuse, NY

Print_ISBN

0-7803-4078-7

Type

conf

DOI

10.1109/NAFIPS.1997.624075

Filename

624075