DocumentCode :
26234
Title :
Intensity Noise Properties of Midinfrared Injection Locked Quantum Cascade Lasers: II. Experiments
Author :
Juretzka, C. ; Simos, H. ; Bogris, A. ; Syvridis, D. ; Elsaber, W. ; Carras, M.
Author_Institution :
Inst. of Appl. Phys., Tech. Univ. Darmstadt, Darmstadt, Germany
Volume :
51
Issue :
1
fYear :
2015
fDate :
Jan. 2015
Firstpage :
1
Lastpage :
8
Abstract :
We present experimental investigations of the intensity noise properties of injection-locked midinfrared emitting quantum cascade lasers. Following the theoretical approach by Simos et al., the injection locking is realized below and near the threshold of the free running slave laser, resulting in an efficient technique to achieve low-noise operation. We find that below the threshold, the locking characteristics as locking range, shape and bandwidth, are different in comparison with those above threshold. In addition, we also investigate injection locking into longitudinal side modes of the slave laser apart by several longitudinal mode hops, and observe similar characteristics, however, with the potential to achieve higher relative intensity noise suppression. The measurements are confirmed by additional numerical simulations with a new model, which considers the multimode spectrum of the slave laser and the spectral profile of the material gain. Under the actual experimental conditions, a reduction of the relative intensity noise of the slave laser of up to 10 dB (above threshold) and up to 20 dB (below threshold) in comparison to the free running slave laser noise level is achieved.
Keywords :
laser modes; laser noise; quantum cascade lasers; free running slave laser; injection locking; intensity noise properties; longitudinal mode hops; midinfrared injection locked quantum cascade lasers; spectral profile; Laser modes; Laser noise; Measurement by laser beam; Optical reflection; Quantum cascade lasers; Quantum cascade lasers; injection locking; intensity noise; optical injection;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2014.2366992
Filename :
6945821
Link To Document :
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