• DocumentCode
    2623429
  • Title

    Thin coatings can provide significant shielding against low frequency EMF/magnetic fields

  • Author

    Dixon, David S. ; Masi, James

  • Author_Institution
    Naval Undersea Warfare Center, Newport, RI, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    24-28 Aug 1998
  • Firstpage
    1035
  • Abstract
    Both military and commercial organizations have concerns about obtaining electromagnetic shielding performance using materials that maintain long term performance in today´s increasingly hostile shipboard and commercial environments. This paper describes the development and testing of several unique coatings consisting of mixtures of semiconductive and conductive nano-particles of both magnetic and nonmagnetic materials. These materials exhibit low frequency shielding characteristics and have demonstrated significant EMI shielding performance against low frequency, near field magnetic sources previously unobtainable using traditional coatings. Shielding performance of over 20 dB for a 100 micron thickness at the 60 Hz powerline frequency has been measured against a solenoidal EMI source. Although performance at the powerline frequencies was the original goal, the validation of performance over a wider frequency band was documented
  • Keywords
    coatings; electromagnetic shielding; nanostructured materials; 100 mum; 60 Hz; EMI shielding performance; commercial environments; conductive nano-particles; electromagnetic shielding performance; low frequency EMF; low frequency magnetic fields; low frequency near field magnetic sources; powerline frequency; semiconductive nano-particles; shipboard environments; solenoidal EMI source; thin coatings; Coatings; Conducting materials; Electromagnetic interference; Electromagnetic shielding; Frequency; Magnetic materials; Magnetic semiconductors; Magnetic shielding; Materials testing; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-5015-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1998.750351
  • Filename
    750351