DocumentCode :
2623721
Title :
Modeling and characterization of integrated passive elements for applications in silicon high frequency systems
Author :
Caverly, Robert H. ; Walsh, Timothy ; Reifsnyder, James ; Pearson, Sean
Author_Institution :
Dept. of Electr. & Comput. Eng., Villanova Univ., PA, USA
fYear :
2004
fDate :
8-10 Sept. 2004
Firstpage :
215
Lastpage :
218
Abstract :
A methodology for robust integrated circuit passive element modeling has been developed. The methodology was used to design process-independent structures in a silicon CMOS process and combined a number of techniques and software packages to ensure run-to-run stability of element values. Experimental data verifying the techniques is presented.
Keywords :
CMOS integrated circuits; HF amplifiers; MOS integrated circuits; capacitors; inductors; integrated circuit modelling; passive networks; silicon; software packages; MOSFET; amplifier; capacitor; element values; inductor; integrated passive elements; passive element modeling; process-independent structures; robust integrated circuit; run-to-run stability; silicon CMOS process; silicon high frequency systems; software packages; Application software; CMOS process; Circuit stability; Frequency; Integrated circuit modeling; Process design; Robustness; Semiconductor device modeling; Silicon; Software packages;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2004. Digest of Papers. 2004 Topical Meeting on
Print_ISBN :
0-7803-8703-1
Type :
conf
DOI :
10.1109/SMIC.2004.1398206
Filename :
1398206
Link To Document :
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