• DocumentCode
    2624139
  • Title

    Material analysis using characteristic transmission spectra

  • Author

    Vavrik, Daniel ; Jakubek, Jan

  • Author_Institution
    Institute of Theoretical and Applied Mechanics of the Czech Academy of Sciences, Prosecka 76, Prague 9, Czech Republic
  • fYear
    2008
  • fDate
    19-25 Oct. 2008
  • Firstpage
    2452
  • Lastpage
    2455
  • Abstract
    Conventional X-ray radiography evaluates the attenuation of X-rays to provide information about the examined object. In this approach it remains difficult to distinguish whether the object features are induced by the object geometry or by the material composition. Measuring the X-ray photon flux together with evaluation of the transmission spectra can solve this problem as will be presented in this paper.
  • Keywords
    Attenuation; Composite materials; Copper; Energy resolution; Fluorescence; Object detection; Spectroscopy; X-ray detection; X-ray detectors; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
  • Conference_Location
    Dresden, Germany
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-2714-7
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2008.4774850
  • Filename
    4774850