DocumentCode :
2624139
Title :
Material analysis using characteristic transmission spectra
Author :
Vavrik, Daniel ; Jakubek, Jan
Author_Institution :
Institute of Theoretical and Applied Mechanics of the Czech Academy of Sciences, Prosecka 76, Prague 9, Czech Republic
fYear :
2008
fDate :
19-25 Oct. 2008
Firstpage :
2452
Lastpage :
2455
Abstract :
Conventional X-ray radiography evaluates the attenuation of X-rays to provide information about the examined object. In this approach it remains difficult to distinguish whether the object features are induced by the object geometry or by the material composition. Measuring the X-ray photon flux together with evaluation of the transmission spectra can solve this problem as will be presented in this paper.
Keywords :
Attenuation; Composite materials; Copper; Energy resolution; Fluorescence; Object detection; Spectroscopy; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
ISSN :
1095-7863
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2008.4774850
Filename :
4774850
Link To Document :
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